Includes bibliographical references (page 148)In the earlier generations the main focus was on the timings and area constraints. Power consumption was considered significant when there was a drastic increase of device densities from 130nm on. As technology advanced from 130nm to 90nm and below there was a significant increase in leakage current due to lesser threshold voltage. High power consumption will cause different problems such as increasing the cost of the product, reducing the reliability, reducing the battery life and many others. Therefore EDA tools were designed to maximize the speed while minimizing area. The main objective of this project is to successfully complete a comparative study of an ASIC design flow using 90 nm SYNOPSY...