A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is presented. It uses the accurate voting model to model bridging faults. SOPS, a compact data structure is used to represent the set of possible faults. This makes the algorithm space efficient. A set of rules is used to reduce the fault list. These rules are based on stuck-at fault simulation, making the algorithm time efficient. The diagnosis algorithm also guarantees that the fault which causes the failure will remain in the final fault list. Experimental results are presented. 1 Introduction In a circuit, when two or more distinct lines are unintentionly connected, due to a defect, we have a bridging fault. In this work we assume that the f...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xp...
If a test set for more complex faults than stuck-at faults is generated, higher defect coverage woul...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging fa...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
A new method to fault diagnosis in combinational circuits is presented. We consider multiple stuck-a...
Abstract — In any circuit that comprises the logic gates, there is possibility of occurrence of fail...
[[abstract]]Fault diagnosis that predicts the most likely fault sites in a faulty chip is an importa...
We study the behavior of feedback bridging faults with non-zero bridge resistance. We demonstrate th...
Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates pred...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The proc...
Abstract: Problem statement: The faults in digital circuit can be classified broadly as single stuck...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xp...
If a test set for more complex faults than stuck-at faults is generated, higher defect coverage woul...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging fa...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
A new method to fault diagnosis in combinational circuits is presented. We consider multiple stuck-a...
Abstract — In any circuit that comprises the logic gates, there is possibility of occurrence of fail...
[[abstract]]Fault diagnosis that predicts the most likely fault sites in a faulty chip is an importa...
We study the behavior of feedback bridging faults with non-zero bridge resistance. We demonstrate th...
Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates pred...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The proc...
Abstract: Problem statement: The faults in digital circuit can be classified broadly as single stuck...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xp...
If a test set for more complex faults than stuck-at faults is generated, higher defect coverage woul...