Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates predictive diagnosis. This paper reports on a diagnosis procedure that uses modified composite signatures constructed from single stuck-at information combined with a lexicographic matching and ranking algorithm. The diagnosis procedure is used to perform highquality bridging fault diagnosis for more than 400,000 diagnostic experiments involving dropping or adding behaviors from the simulations of faulty circuits. 1 Introduction Accurate fault diagnosis is an integral part of failure analysis. The purpose of fault diagnosis is to specify a part of the chip to examine in order to determine the cause of failure. Traditional fault diagnosis compare...
Abstract — Fault diagnosis plays an important role in physical failure analysis and yield learning p...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
All products in the Very-Large-Scale-Integrated-Circuit (VLSIC) industry go through three major stag...
[[abstract]]Fault diagnosis that predicts the most likely fault sites in a faulty chip is an importa...
[[abstract]]This paper addresses the problem of locating the stuck-open faults in a manufactured IC ...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
A new fault model is developed for estimating the coverage of physical defects in digital circuits f...
[[abstract]]Uses data collected from benchmark circuit simulations to examine the relationship betwe...
Abstract — Fault diagnosis plays an important role in physical failure analysis and yield learning p...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
All products in the Very-Large-Scale-Integrated-Circuit (VLSIC) industry go through three major stag...
[[abstract]]Fault diagnosis that predicts the most likely fault sites in a faulty chip is an importa...
[[abstract]]This paper addresses the problem of locating the stuck-open faults in a manufactured IC ...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
A new fault model is developed for estimating the coverage of physical defects in digital circuits f...
[[abstract]]Uses data collected from benchmark circuit simulations to examine the relationship betwe...
Abstract — Fault diagnosis plays an important role in physical failure analysis and yield learning p...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...