104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated technique that uses a combination of static and dynamic processing for the diagnosis of bridging faults in sequential circuits is presented. During diagnosis, the failing outputs from the test are used to adaptively determine the behavior of the bridge at each time-frame. Selective faulty state information is stored by performing accurate bridging fault simulation once before diagnosis. During diagnosis, the state information is used to increase the accuracy of diagnosis. The combination of adaptive simulation, state storage, and path-tracing has low computational requirements.U of I OnlyRestricted to the U of I community idenfinitely during batch ...
In this paper we give an overview of recent work in extraction, simulation, and IDDQ test generation...
Abstract—Fault diagnosis is important in improving the circuitdesign process and the manufacturing y...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging fa...
122 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Finally, we present a diagnos...
Fault diagnosis techniques for digital integrated circuits have been classified into three categorie...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates pred...
Integrated fault diagnosis techniques attempt to overcome the limitations associated with static (pr...
Fault diagnosis techniques for digital integrated circuits can been classified into three categories...
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
In this paper we give an overview of recent work in extraction, simulation, and IDDQ test generation...
Abstract—Fault diagnosis is important in improving the circuitdesign process and the manufacturing y...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging fa...
122 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Finally, we present a diagnos...
Fault diagnosis techniques for digital integrated circuits have been classified into three categorie...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates pred...
Integrated fault diagnosis techniques attempt to overcome the limitations associated with static (pr...
Fault diagnosis techniques for digital integrated circuits can been classified into three categories...
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
In this paper we give an overview of recent work in extraction, simulation, and IDDQ test generation...
Abstract—Fault diagnosis is important in improving the circuitdesign process and the manufacturing y...
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnos...