We study the behavior of feedback bridging faults with non-zero bridge resistance. We demonstrate that a test vector may detect the fault, not detect the fault or lead to oscillation, depending on bridge resistance. Even loops going through a gate with controlling values on its side inputs (which we call disabled loops) expose non-trivial behavior. We outline the multiple strengths problem which arises due to the fact that a critical bridge resistance depends on the strengths of the signals driving the bridge, which in turn are functions of the number of the on-transistors, these again depending on the bridge resistance, making such a fault very hard to resolve. We conclude that the complexity of resistive feedback bridging fault simulation...
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
Multiple voltage is an effective dynamic power reduction design technique commonly used in low-power...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...
Download Citation Email Print Request Permissions Feedback bridging faults may giv...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly ...
We describe a system for generating accurate tests for bridge faults (with or without feedback) in C...
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based gene...
The growing dispersion of ICs' parameters poses relevant uncertainties on gate output conductances...
This paper analyses the behaviour of resistive bridging faults under process variation and shows tha...
This paper analyzes the detectability of resistive bridging faults in CMOS (micro)-pipelined circuit...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
Abstract—This paper analyses the behaviour of resistive bridg-ing faults under process variation and...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
Multiple voltage is an effective dynamic power reduction design technique commonly used in low-power...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...
Download Citation Email Print Request Permissions Feedback bridging faults may giv...
A novel algorithm for diagnosing all two-line single bridging faults in combinational circuits is pr...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly ...
We describe a system for generating accurate tests for bridge faults (with or without feedback) in C...
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based gene...
The growing dispersion of ICs' parameters poses relevant uncertainties on gate output conductances...
This paper analyses the behaviour of resistive bridging faults under process variation and shows tha...
This paper analyzes the detectability of resistive bridging faults in CMOS (micro)-pipelined circuit...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
Abstract—This paper analyses the behaviour of resistive bridg-ing faults under process variation and...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
Multiple voltage is an effective dynamic power reduction design technique commonly used in low-power...
The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conduct...