A tree growing technique is used here together with classical scheduling algorithms in order to improve the test concurrency having assigned power dissipation limits. First of all, the problem of unequal-length block-test scheduling under power dissipation constraints is modeled as a tree growing problem. Then a combination of list and force-directed scheduling algorithms is adapted to tackle it. The goal of this approach is to achieve rapidly a test scheduling solution with a near-optimal test application time. This is initially achieved with the list approach. Then the power dissipation distribution of this solution is balanced by using a force-directed global priority function. The force-directed priority function is a distribution-graph...
AbstractThis paper presents a practical approach to parallelize the test data generation algorithm b...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
AbstractThis paper presents a practical approach to parallelize the test data generation algorithm b...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
AbstractThis paper presents a practical approach to parallelize the test data generation algorithm b...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...