A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm
The current semiconductor technology allows integration of all components onto a single chip called ...
The development of a new semi-conductor manufacturing system, like the ASML waferscanner, is mainly ...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
The current semiconductor technology allows integration of all components onto a single chip called ...
The development of a new semi-conductor manufacturing system, like the ASML waferscanner, is mainly ...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
The current semiconductor technology allows integration of all components onto a single chip called ...
The development of a new semi-conductor manufacturing system, like the ASML waferscanner, is mainly ...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...