In this paper we present a method of parallelizing test generation for combinational logic using boolean satisfiability. We propose a dynamic search-space allocation strategy to split work between the available processors. This strategy is easy to implement with a greedy heuristic and is economical in its demand for inter-processor communication. We derive an analytical model to predict the performance of the parallel versus sequential implementations. The effectiveness of our method and analysis is demonstrated by an implementation on a Sequent (shared memory) multiprocessor. The experimental data shows significant performance improvement in parallel implementation, validates our analytical model, and allows predictions of performance for ...
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation (EDA). It finds...
We present novel algorithms for parallel testing of code that takes structurally complex test inputs...
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel tech...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
Recently, Larrabee proposed a sequential test generation algorithm for combinational circuits based ...
An Automatic Test Pattern Generator is an indispensable tool in the production of reliable computer ...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
The increasing complexity of logic circuits has made the problem of test generation intractable. In ...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
Li, XiaomingThe Boolean Satisfiability Problem (SAT) is a well-known and core problem in computer sc...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
We show how to exploit the 32/64 bit architecture of modern computers to accelerate some of the algo...
Taking advantage of multi-core architectures can provide significant improvement for many design aut...
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation (EDA). It finds...
We present novel algorithms for parallel testing of code that takes structurally complex test inputs...
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel tech...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
Recently, Larrabee proposed a sequential test generation algorithm for combinational circuits based ...
An Automatic Test Pattern Generator is an indispensable tool in the production of reliable computer ...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
The increasing complexity of logic circuits has made the problem of test generation intractable. In ...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
Li, XiaomingThe Boolean Satisfiability Problem (SAT) is a well-known and core problem in computer sc...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
We show how to exploit the 32/64 bit architecture of modern computers to accelerate some of the algo...
Taking advantage of multi-core architectures can provide significant improvement for many design aut...
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation (EDA). It finds...
We present novel algorithms for parallel testing of code that takes structurally complex test inputs...
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel tech...