Taking advantage of multi-core architectures can provide significant improvement for many design automation problems. However, the parallelization procedure introduces challenges such as workload duplication, limited search space exploration and race contention among different threads. In this work we propose a parallel framework for ATPG using shared memory multi-core systems that supports test generation for both single-detect and multiple-detect fault models. The framework follows a two-epoch approach, each focusing on a different category of faults, during which a test seed generation is followed by compatibility merging. Various optimization techniques are incorporated in each epoch, designed to achieve higher speed-up for the overall ...
The increasing complexity of logic circuits has made the problem of test generation intractable. In ...
Mutation testing is a fault-based testing strategy to measure the quality of testing by inserting fa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
Current and future multicore architectures can significantly accelerate the performance of test auto...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
Abstract Efficient utilization of the inherent parallelism of multi-core architectures is a grand ch...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
110 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.All implementations were done...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
Microprocessor error detection is increasingly important, as the number of transistors in modern sys...
[[abstract]]Hundreds of memory cores can be found on a typical system-on-chip (SOC) today. Diagnosin...
Mutation testing is a valuable technique for measuring the quality of test suites in terms of detect...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
The increasing complexity of logic circuits has made the problem of test generation intractable. In ...
Mutation testing is a fault-based testing strategy to measure the quality of testing by inserting fa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
Current and future multicore architectures can significantly accelerate the performance of test auto...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
Abstract Efficient utilization of the inherent parallelism of multi-core architectures is a grand ch...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
110 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.All implementations were done...
In this paper we present a method of parallelizing test generation for combinational logic using boo...
Microprocessor error detection is increasingly important, as the number of transistors in modern sys...
[[abstract]]Hundreds of memory cores can be found on a typical system-on-chip (SOC) today. Diagnosin...
Mutation testing is a valuable technique for measuring the quality of test suites in terms of detect...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
The increasing complexity of logic circuits has made the problem of test generation intractable. In ...
Mutation testing is a fault-based testing strategy to measure the quality of testing by inserting fa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...