Add to ORKG110 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.All implementations were done using the MPI communication library and are therefore portable to many parallel platforms. All algorithms provide excellent performance in terms of speedup and quality on both shared-memory and distributed-memory parallel platforms.U of I OnlyRestricted to the U of I community idenfinitely during batch ingest of legacy ETD
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
Simulation has become indispensable in the process of designing, verifying, and testing complex digi...
110 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.All implementations were done...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
Abstract We present a new multiprocessor sequential circuit fault simulator, Zamlog, b ased on a nov...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
INTRODUCTION 1.1. Parallel Processing for VLSI CAD With the increased complexity of VLSI circuits, e...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simu...
I would like to thank the entire staff and my fellow students at the institute for creating a friend...
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
Simulation has become indispensable in the process of designing, verifying, and testing complex digi...
110 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.All implementations were done...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
Abstract We present a new multiprocessor sequential circuit fault simulator, Zamlog, b ased on a nov...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
We report a new parallel test generation algorithm, ProperTEST, for sequential circuits that is port...
INTRODUCTION 1.1. Parallel Processing for VLSI CAD With the increased complexity of VLSI circuits, e...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
Automatic Test Pattern Generation (ATPG) is known to be an NP hard problem. To solve such problems, ...
Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simu...
I would like to thank the entire staff and my fellow students at the institute for creating a friend...
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
In this paper, we describe distributed algorithms for combinational fault simulation assuming the cl...
Simulation has become indispensable in the process of designing, verifying, and testing complex digi...