A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block-test scheduling under power dissipation constraints. An extended tree growing technique is also used in combination with the list scheduling algorithm in order to improve the test concurrency, having assigned power dissipation limits. Moreover, the algorithm features a power dissipation balancing provision. Test scheduling examples are discussed, highlighting further research steps towards an efficient system-level test scheduling algorith
Power consumption has become a crucial concern in built-in self-test (BIST) due to the increased swi...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
The current semiconductor technology allows integration of all components onto a single chip called ...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Power consumption has become a crucial concern in built-in self-test (BIST) due to the increased swi...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Traditional DFT methodologies increase useless power dissipation during testing and are not su...
The first part of this thesis addresses the problem of power dissipation during test in the system i...
The current semiconductor technology allows integration of all components onto a single chip called ...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Power consumption has become a crucial concern in built-in self-test (BIST) due to the increased swi...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...