Classical scheduling approaches are applied here to overcome the problem of unequal-length block-test schedul-ing under power dissipation constraints. List scheduling-like approaches are proposed j r s t as greedy algorithms to tackle the fore mentioned problem. Then, distribution-graph based approaches are described in order to achieve balanced test concurrency and test power dissipation. An extended tree growing technique is also used in combina-tion with these classical approaches in order to improve the test concurrency having assignedpower dissipation lim-its. A comparison between the results of the test scheduling experiments highlights the advantages and disadvantages of applying different classical scheduling algorithms to the power...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
We present optimal solutions to the test scheduling problem for core-based systems. We show that tes...
Abstract—We discuss the test scheduling problem in this paper. We first provide a historical perspec...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Power consumption has become a crucial concern in built-in self-test (BIST) due to the increased swi...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...
Classical scheduling approaches are applied here to overcome the problem of unequal-length block-tes...
A list scheduling approach is proposed in this paper to overcome the problem of unequal-length block...
A tree growing technique is used here together with classical scheduling algorithms in order to impr...
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing t...
A left-edge algorithm approach is proposed in this paper to deal with the problem of unequal-length ...
As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser ...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
We present optimal solutions to the test scheduling problem for core-based systems. We show that tes...
Abstract—We discuss the test scheduling problem in this paper. We first provide a historical perspec...
During test, circuits are exposed to an increased switching activity which can rise severe hazards t...
Power consumption has become a crucial concern in built-in self-test (BIST) due to the increased swi...
This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules wit...
With the development of VLSI technologies, especially with the coming of deep sub-micron semiconduct...
Includes bibliographical references (leaves 83-84).This study presents an evolutionary approach to s...
Test scheduling is crucially important for optimal SoC test automation in allocating the limited ava...