In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when the lifetime of a product follows a generalized inverted Rayleigh distribution (GIRD). Based on Type II censoring, the maximum likelihood estimates (MLEs) of model parameters are obtained. Also, the asymptotic variances and covariances matrix of the estimators is studied. The optimum proportion of test units failing at normal and accelerate condition according to a certain optimality criterion in optimum test plans are discussed. The performance of the estimators are compared through Monte Carlo simulation study. Finally, numerical examples and concluding remarks are provided
The present article, studied about the Bayes risks of the unknown parameters of the generalized Inve...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This article considers the problem of estimating the unknown parameters of the compound Rayleigh dis...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-II ...
The problem of testing the product units under stress higher than normal stress conditions is widely...
The constant-partially accelerated life tests (PALTs) model under progressive first-failure censorin...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
The present article, studied about the Bayes risks of the unknown parameters of the generalized Inve...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This article considers the problem of estimating the unknown parameters of the compound Rayleigh dis...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-II ...
The problem of testing the product units under stress higher than normal stress conditions is widely...
The constant-partially accelerated life tests (PALTs) model under progressive first-failure censorin...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
The present article, studied about the Bayes risks of the unknown parameters of the generalized Inve...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...