Add to ORKGAbstract. This paper discusses step-stress partially accelerated life test under progressive type-II censoring with random removals. The removals from the test are assumed to have binomial distributions. The lifetimes of the test units are considered to be exponential distributed. The maximum likelihood procedure is followed to estimate the unknown parameters of the model. Optimum test plan is developed using the D-optimality criterion. Monte Carlo Simulation technique is applied to illustrate the theoretical results discussed in this paper
Maximum likelihood estimator, Optimum test plan, Progressive type-II censoring, Step-stress accelera...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
Maximum likelihood estimator, Optimum test plan, Progressive type-II censoring, Step-stress accelera...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
Maximum likelihood estimator, Optimum test plan, Progressive type-II censoring, Step-stress accelera...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...