In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II censoring scheme is investigated when the lifetimes of test units follow the two-parameter inverted exponential distribution. The maximum likelihood estimation method is used to estimate the unknown parameters and acceleration factor. Under the normal use condition, the maximum likelihood estimators of the reliability and hazard rate functions are also calculated. In addition, the observed Fisher information matrix is produced and employed to determine the approximate confidence intervals of the unknown parameters. Furthermore, for the reliability and hazard rate functions, the delta method is used to construct the approximate confidence interv...
In this paper, step-stress partially accelerated life tests SSPALTare applied when the lifetime of a...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
The present paper explores estimating failure time data under step-stress partially accelerated life...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]With today's high technology, many products last so long that life testing at usual cond...
In this paper, the estimations of linear exponential distribution parameters and the acceleration fa...
In this paper, inverse Weibull (IW) distribution with the step-stress model and progressive type-II ...
The problem of testing the product units under stress higher than normal stress conditions is widely...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In reliability and life-testing experiments, the researcher is often interested in the effects of ex...
The step-stress accelerated life tests allow the experimenter to increase the stress levels at fixed...
Based on progressive censoring, step-stress partially accelerated life tests are considered when the...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
In this article, we present the parameter inference in step-stress accelerated life tests under the ...
In this paper, step-stress partially accelerated life tests SSPALTare applied when the lifetime of a...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
The present paper explores estimating failure time data under step-stress partially accelerated life...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]With today's high technology, many products last so long that life testing at usual cond...
In this paper, the estimations of linear exponential distribution parameters and the acceleration fa...
In this paper, inverse Weibull (IW) distribution with the step-stress model and progressive type-II ...
The problem of testing the product units under stress higher than normal stress conditions is widely...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In reliability and life-testing experiments, the researcher is often interested in the effects of ex...
The step-stress accelerated life tests allow the experimenter to increase the stress levels at fixed...
Based on progressive censoring, step-stress partially accelerated life tests are considered when the...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
In this article, we present the parameter inference in step-stress accelerated life tests under the ...
In this paper, step-stress partially accelerated life tests SSPALTare applied when the lifetime of a...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
The present paper explores estimating failure time data under step-stress partially accelerated life...