type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PALT) where a pre-specified censoring time is involved. The time to failure is assumed to have a two-parameter Pareto lifetime distribution of the second kind. Maximum likelihood estimates (MLE) of the PALT model parameters are obtained. In addition, confidence intervals estimation for the parameters is presented. Optimum plans for simple step-stress PALT are also considered. Such plans minimize the generalized asymptotic variance (GAV) of the MLE of the model parameters. For illustration, numerical examples are given. 1
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when t...
Based on progressive censoring, step-stress partially accelerated life tests are considered when the...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This paper considers the case of Constant-Stress Partially Accelerated Life Testing (CSPALT) when tw...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when t...
Based on progressive censoring, step-stress partially accelerated life tests are considered when the...
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compoun...
This paper considers the case of Constant-Stress Partially Accelerated Life Testing (CSPALT) when tw...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when t...
Based on progressive censoring, step-stress partially accelerated life tests are considered when the...