Add to ORKGThis paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compound distributions where the experiment is subject to type-II censoring. The time to failure is assumed to have a compound two-parameter Pareto lifetime distribution. Maximum likelihood estimators (MLE) of PALT model parameters are obtained. Also, confidence interval estimation of the parameters is presented. Moreover, optimum plans for simple time-step-stress PALT are developed. Such plans minimize the generalized asymptotic variance (GAV) of the MLE of the model parameters. For illustration, numerical examples are included
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This paper considers the case of Constant-Stress Partially Accelerated Life Testing (CSPALT) when tw...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when t...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
In this paper, step-stress partially accelerated life tests SSPALTare applied when the lifetime of a...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
type-I censoring. This paper deals with simple time-step stress Partially Accelerated Life Tests (PA...
This paper considers the case of Constant-Stress Partially Accelerated Life Testing (CSPALT) when tw...
This article discusses k-stage step-stress partially accelerated life test under Type-I progressive ...
This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed th...
This paper deals with simple constant-stress Partially Accelerated Life Tests (PALT) with Type-II ce...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests...
In this paper, failure step stress-partially accelerated life tests (FSS-PALT) are considered when t...
This paper considers optimum plans for failure-step stress partially accelerated life tests with two...
In this paper, step-stress partially accelerated life tests SSPALTare applied when the lifetime of a...
This study deals with simple Constant Stress Partially Accelerated life test (CSPALT) using type-I c...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...