GaN-on-SiC MMIC Production for S-Band and EW-Band Applications

An overview of Cree’s Title III production-capacity program for GaN-on-SiC MMIC on 100-mm-diameter substrates is presented. This program is focused on Manufacturing Readiness Assessments (MRA) of key metrics including reliability (T50 and T1) yield, cost, and cycle time. The final program requirement is a Manufacturing Readiness Level (MRL) of eight (8) or higher. I