Add to ORKG"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear Agency, the Defense Advanced Research Projects Agency, and the Navy Strategic Systems Project Office.Mode of access: Internet
"Issued: January 1963."Includes bibliographical references (page 64).U.S. Atomic Energy Commission C...
Included are 464 selected references on the theory, manufacture, properties, performance, and utliiz...
NBS activities in developing methods of measurement for semiconductor materials, process control, an...
"Jointly sponsored by the National Bureau of Standards [and other agencies]."Includes bibliographica...
Supt. of Docs. no.: C13.10: 400-45.Includes bibliographical references.Mode of access: Internet
Issued November 1979.Includes bibliographical references and index.Mode of access: Internet
Title varies slightly.Mode of access: Internet.Continued by: United States. Institute for Applied Te...
At head of title: Economic report, January 1977.Includes bibliographies.Mode of access: Internet
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Prepared for Division of Safeguards, Fuel Cycle and Environmental Research, Office of Nuclear Regula...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Electrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor device
"February 1992."Shipping list no.: 92-152-P.Vol. [2] title: A National strategy for semiconductors: ...
Includes bibliographical references (page 47).U.S. Atomic Energy Commission Contract ;Mode of access...
"The Semiconductor Electronics Division"--P. 1."January, 1990"--P. [12].Shipping list no.: 90-235-P....
"Issued: January 1963."Includes bibliographical references (page 64).U.S. Atomic Energy Commission C...
Included are 464 selected references on the theory, manufacture, properties, performance, and utliiz...
NBS activities in developing methods of measurement for semiconductor materials, process control, an...
"Jointly sponsored by the National Bureau of Standards [and other agencies]."Includes bibliographica...
Supt. of Docs. no.: C13.10: 400-45.Includes bibliographical references.Mode of access: Internet
Issued November 1979.Includes bibliographical references and index.Mode of access: Internet
Title varies slightly.Mode of access: Internet.Continued by: United States. Institute for Applied Te...
At head of title: Economic report, January 1977.Includes bibliographies.Mode of access: Internet
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Prepared for Division of Safeguards, Fuel Cycle and Environmental Research, Office of Nuclear Regula...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Electrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor device
"February 1992."Shipping list no.: 92-152-P.Vol. [2] title: A National strategy for semiconductors: ...
Includes bibliographical references (page 47).U.S. Atomic Energy Commission Contract ;Mode of access...
"The Semiconductor Electronics Division"--P. 1."January, 1990"--P. [12].Shipping list no.: 90-235-P....
"Issued: January 1963."Includes bibliographical references (page 64).U.S. Atomic Energy Commission C...
Included are 464 selected references on the theory, manufacture, properties, performance, and utliiz...
NBS activities in developing methods of measurement for semiconductor materials, process control, an...