Semiconductor measurement technology October 1, 1976 to March 31, 1977 /

1.1 micrometer and visible emission semiconductor diode lasers /

Ladany, I.
Kressel, H., joint author.
Nuese, C. J., joint author.
RCA Laboratories.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Office.

January 1978

Oct. 1978.Contract NAS 1-14349.Includes bibliographical references.Mode of access: Internet

Semiconductor measurement technology : microelectronic ultrasonic bonding /

Harman, George G.
United States. National Bureau of Standards.

"Jointly supported by: the National Bureau of Standards ... [et al.]."Bibliography: p. 98-99.Mode of...

Thermoelectric measurements at small-area contacts /

Cutler, M.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"September 15, 1960."Includes bibliographical references (page 28).Mode of access: Internet

Semiconductor measurement technology : [progress report] April 1, 1977 to September 30, 1977 /

Bullis, W. Murray, 1930-
United States. National Bureau of Standards. Special publication.
United States. National Bureau of Standards.

January 1980

Supt. of Docs. no.: C13.10: 400-45.Includes bibliographical references.Mode of access: Internet

Semiconductor measurement technology: progress report, January 1 to June 30, 1975 /

Bullis, W. Murray, 1930- ed.
United States. National Bureau of Standards. Special publication.

January 1976

"Jointly sponsored by the National Bureau of Standards [and other agencies]."Includes bibliographica...

Semiconductor measurement technology : quarterly report, July 1 to September 30, 1974 /

Bullis, W. Murray, 1930-
United States. Navy Strategic Systems Projects Office.
United States. Defense Advanced Research Projects Agency.
United States. Defense Nuclear Agency.
United States. National Bureau of Standards.

January 1975

"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...

Semiconductor measurement technology:

Institute for Applied Technology (U.S.). Electronic Technology Division.

Title varies slightly.Mode of access: Internet.Continued by: United States. Institute for Applied Te...

Semiconductor device physics.

Nussbaum, Allen.

January 1962

Prentice-Hall international series in electrical engineering.Includes bibliography.Mode of access: I...

Semiconductor photoelectrochemistry /

Buoncristiani, A. Martin.
Byvik, Charles E.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.

January 1983

"January 1983"--Cover.Includes bibliographical references.Mode of access: Internet

Electronic measurements /

Terman, Frederick Emmons, 1900-1982.
Pettit, Joseph M. (Joseph Mayo) joint author.

January 1952

First ed. published in 1935 under title: Measurements in radio engineering.Includes bibliographical ...

High temperature semiconductors for thermoelectric conversion /

Kurnick, S.W.
Leavy, J.F. author.
Fitzpatrick, R.L. author.
Cutler, M. author.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"December 1, 1960."Includes bibliographical references (page 9).Mode of access: Internet

The semiconductor industry : a survey of structure, conduct, and performance, staff report to the Federal Trade Commission.

Webbink, Douglas W
United States. Federal Trade Commission

At head of title: Economic report, January 1977.Includes bibliographies.Mode of access: Internet

Galvanomagnetic measurements in highly conducting semiconductors /

Kurnick, S.W.
Fitzpatrick, R.L. author.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"December 12, 1960."Includes bibliographical references (page 3).Mode of access: Internet

Modulation measurements for microwave mixers /

Kenney, James M.
United States. National Bureau of Standards. Special publication.

January 1980

"Issued February 1980."Includes bibliographical references.Mode of access: Internet

National Semiconductor Metrology Program : [catalog] /

National Institute of Standards and Technology (U.S.)
National Semiconductor Metrology Program (U.S.)
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.

January 1995

Title from cover.Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).Mod...

1.1 micrometer and visible emission semiconductor diode lasers /

Ladany, I.
Kressel, H., joint author.
Nuese, C. J., joint author.
RCA Laboratories.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Office.

January 1978

Oct. 1978.Contract NAS 1-14349.Includes bibliographical references.Mode of access: Internet

Semiconductor measurement technology : microelectronic ultrasonic bonding /

Harman, George G.
United States. National Bureau of Standards.

"Jointly supported by: the National Bureau of Standards ... [et al.]."Bibliography: p. 98-99.Mode of...

Thermoelectric measurements at small-area contacts /

Cutler, M.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"September 15, 1960."Includes bibliographical references (page 28).Mode of access: Internet

Semiconductor measurement technology : [progress report] April 1, 1977 to September 30, 1977 /

Bullis, W. Murray, 1930-
United States. National Bureau of Standards. Special publication.
United States. National Bureau of Standards.

January 1980

Supt. of Docs. no.: C13.10: 400-45.Includes bibliographical references.Mode of access: Internet

Semiconductor measurement technology: progress report, January 1 to June 30, 1975 /

Bullis, W. Murray, 1930- ed.
United States. National Bureau of Standards. Special publication.

January 1976

"Jointly sponsored by the National Bureau of Standards [and other agencies]."Includes bibliographica...

Semiconductor measurement technology : quarterly report, July 1 to September 30, 1974 /

Bullis, W. Murray, 1930-
United States. Navy Strategic Systems Projects Office.
United States. Defense Advanced Research Projects Agency.
United States. Defense Nuclear Agency.
United States. National Bureau of Standards.

January 1975

"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...

Semiconductor measurement technology:

Institute for Applied Technology (U.S.). Electronic Technology Division.

Title varies slightly.Mode of access: Internet.Continued by: United States. Institute for Applied Te...

Semiconductor device physics.

Nussbaum, Allen.

January 1962

Prentice-Hall international series in electrical engineering.Includes bibliography.Mode of access: I...

Semiconductor photoelectrochemistry /

Buoncristiani, A. Martin.
Byvik, Charles E.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.

January 1983

"January 1983"--Cover.Includes bibliographical references.Mode of access: Internet

Electronic measurements /

Terman, Frederick Emmons, 1900-1982.
Pettit, Joseph M. (Joseph Mayo) joint author.

January 1952

First ed. published in 1935 under title: Measurements in radio engineering.Includes bibliographical ...

High temperature semiconductors for thermoelectric conversion /

Kurnick, S.W.
Leavy, J.F. author.
Fitzpatrick, R.L. author.
Cutler, M. author.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"December 1, 1960."Includes bibliographical references (page 9).Mode of access: Internet

The semiconductor industry : a survey of structure, conduct, and performance, staff report to the Federal Trade Commission.

Webbink, Douglas W
United States. Federal Trade Commission

At head of title: Economic report, January 1977.Includes bibliographies.Mode of access: Internet

Galvanomagnetic measurements in highly conducting semiconductors /

Kurnick, S.W.
Fitzpatrick, R.L. author.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"December 12, 1960."Includes bibliographical references (page 3).Mode of access: Internet

Modulation measurements for microwave mixers /

Kenney, James M.
United States. National Bureau of Standards. Special publication.

January 1980

"Issued February 1980."Includes bibliographical references.Mode of access: Internet

National Semiconductor Metrology Program : [catalog] /

National Institute of Standards and Technology (U.S.)
National Semiconductor Metrology Program (U.S.)
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.

January 1995

Title from cover.Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).Mod...

1.1 micrometer and visible emission semiconductor diode lasers /

Ladany, I.
Kressel, H., joint author.
Nuese, C. J., joint author.
RCA Laboratories.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Office.

January 1978

Oct. 1978.Contract NAS 1-14349.Includes bibliographical references.Mode of access: Internet

Semiconductor measurement technology : microelectronic ultrasonic bonding /

Harman, George G.
United States. National Bureau of Standards.

"Jointly supported by: the National Bureau of Standards ... [et al.]."Bibliography: p. 98-99.Mode of...

Thermoelectric measurements at small-area contacts /

Cutler, M.
United States. Maritime Administration.
General Dynamics Corporation. General Atomic Division.
U.S. Atomic Energy Commission.

January 1960

"September 15, 1960."Includes bibliographical references (page 28).Mode of access: Internet

Semiconductor measurement technology October 1, 1976 to March 31, 1977 /

Abstract

Extracted data

Semiconductor measurement technology October 1, 1976 to March 31, 1977 /

Abstract

Extracted data

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