Add to ORKGElectrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor device
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Measurement apparatus for broad thermal conductivity testing of aerospace alloys used in low tempera...
Automated Hall effect and resistivity apparatus for studying electrical transport properties of semi...
NBS activities in developing methods of measurement for semiconductor materials, process control, an...
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Activities directed toward the development of methods of measurement for semiconductor materials, pr...
This progress report describes NBS activities directed toward the development of methods of measurem...
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconduct...
The development of methods of measurement for semiconductor materials, process control, and devices ...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Measurement technology for semiconductor materials, process control, and devices, is discussed. Sili...
Electrical resistivity measurements on pure metals in temperature range 0 to 273
Thermal conductivity and diffusivity and electrical resistivity of solids at low temperature
The current status of NBS work on measurement technology for semiconductor materials, process contro...
"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Measurement apparatus for broad thermal conductivity testing of aerospace alloys used in low tempera...
Automated Hall effect and resistivity apparatus for studying electrical transport properties of semi...
NBS activities in developing methods of measurement for semiconductor materials, process control, an...
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Activities directed toward the development of methods of measurement for semiconductor materials, pr...
This progress report describes NBS activities directed toward the development of methods of measurem...
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconduct...
The development of methods of measurement for semiconductor materials, process control, and devices ...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Measurement technology for semiconductor materials, process control, and devices, is discussed. Sili...
Electrical resistivity measurements on pure metals in temperature range 0 to 273
Thermal conductivity and diffusivity and electrical resistivity of solids at low temperature
The current status of NBS work on measurement technology for semiconductor materials, process contro...
"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Measurement apparatus for broad thermal conductivity testing of aerospace alloys used in low tempera...
Automated Hall effect and resistivity apparatus for studying electrical transport properties of semi...