Add to ORKGNBS activities in developing methods of measurement for semiconductor materials, process control, and device
A selective bibliography is given on electrical characterization techniques for semiconductors. Emph...
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Technical information is presented on measurement techniques and instruments, measurement applicatio...
Electrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor device
The development of methods of measurement for semiconductor materials, process control, and devices ...
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Activities directed toward the development of methods of measurement for semiconductor materials, pr...
This progress report describes NBS activities directed toward the development of methods of measurem...
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconduct...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Measurement technology for semiconductor materials, process control, and devices, is discussed. Sili...
The current status of NBS work on measurement technology for semiconductor materials, process contro...
A literature survey is presented covering nondestructive methods of electrical characterization of s...
Interrelation of process techniques and space radiation effects in metal oxide semiconductor
"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...
A selective bibliography is given on electrical characterization techniques for semiconductors. Emph...
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Technical information is presented on measurement techniques and instruments, measurement applicatio...
Electrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor device
The development of methods of measurement for semiconductor materials, process control, and devices ...
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process c...
Activities directed toward the development of methods of measurement for semiconductor materials, pr...
This progress report describes NBS activities directed toward the development of methods of measurem...
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconduct...
Measurement technology for semiconductor materials, process control, and devices is reviewed. Activi...
Measurement technology for semiconductor materials, process control, and devices, is discussed. Sili...
The current status of NBS work on measurement technology for semiconductor materials, process contro...
A literature survey is presented covering nondestructive methods of electrical characterization of s...
Interrelation of process techniques and space radiation effects in metal oxide semiconductor
"May 1975."Includes bibliographies and index.Interim report.Sponsored in part by the Defense Nuclear...
A selective bibliography is given on electrical characterization techniques for semiconductors. Emph...
Measurement and interpretation of Hall coefficient and resistivity of semiconductor
Technical information is presented on measurement techniques and instruments, measurement applicatio...