Electronics Products that achieve high levels of integrated communications, computing and entertainment, multimedia features in small, stylish and robust new form factors are winning in the market place. Due to the high costs that an industry may undergo and how a high yield is directly proportional to high profits, IC (Integrated Circuit) manufacturers struggle to maximize yield, but today-s customers demand miniaturization, low costs, high performance and excellent reliability making the yield maximization a never ending research of an enhanced assembly process. With factors such as minimum tolerances, tighter parameter variations a systematic approach is needed in order to predict the assembly process. In order to evaluate the quality of...
Abstract The dimension of transistors shrinks with each new technology developed in the semiconducto...
Today's customers demand high quality, customized goods and services, quickest delivery. This has ma...
129 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.We present improved yield mod...
Concurrent engineering in electronic manufacturing industries assures product quality through the in...
Flip-chip assembly, developed in the early 1960s, is now being positioned as a key joining technolog...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The paper deals with optimization of printed circuit board assembly (PCBA) design based on defects p...
Spot defects represent the main challenge for enhancement of semiconductor manufacturing yield. As a...
The paper deals with optimization of printed circuit board assembly (PCBA) design based on defects p...
Spot defects represent the main challenge for enhancement of semiconductor manufacturing yield. As a...
The dimension of transistors shrinks with each new technology developed in the semiconductor industr...
When calculating the production costs input data can vary considerably inquality between different c...
One problem in semiconductor manufacturing optimization is to find an optimal release rate of raw ma...
In modern manufacturing, a product consists of many components created by different processes. Varia...
An integrated circuits become increasingly complex, geometries smaller and smaller, it has become mo...
Abstract The dimension of transistors shrinks with each new technology developed in the semiconducto...
Today's customers demand high quality, customized goods and services, quickest delivery. This has ma...
129 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.We present improved yield mod...
Concurrent engineering in electronic manufacturing industries assures product quality through the in...
Flip-chip assembly, developed in the early 1960s, is now being positioned as a key joining technolog...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The paper deals with optimization of printed circuit board assembly (PCBA) design based on defects p...
Spot defects represent the main challenge for enhancement of semiconductor manufacturing yield. As a...
The paper deals with optimization of printed circuit board assembly (PCBA) design based on defects p...
Spot defects represent the main challenge for enhancement of semiconductor manufacturing yield. As a...
The dimension of transistors shrinks with each new technology developed in the semiconductor industr...
When calculating the production costs input data can vary considerably inquality between different c...
One problem in semiconductor manufacturing optimization is to find an optimal release rate of raw ma...
In modern manufacturing, a product consists of many components created by different processes. Varia...
An integrated circuits become increasingly complex, geometries smaller and smaller, it has become mo...
Abstract The dimension of transistors shrinks with each new technology developed in the semiconducto...
Today's customers demand high quality, customized goods and services, quickest delivery. This has ma...
129 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.We present improved yield mod...