This conference paper is devoted to an experimen- tal assessment of a bi-polar near-field far-field (NFFF) transforma- tion with probe compensation, which is particularly convenient from the data reduction standpoint when characterising a flat an- tenna under test (AUT). The proposed technique utilizes the non- redundant sampling representations of the electromagnetic fields for developing an efficient probe voltage sampling representation on the scan plane, which requires the knowledge of the NF bi-polar samples at a reduced number of sampling points. Then, these sam- ples are suitably interpolated by a two-dimensional optimal sam- pling interpolation expansion to accurately reconstruct the plane- rectangular NF data needed by the standard...