Many integrated circuits are connected to their packaging pins through bondwires. Due to the low cost of bondwires, there is interest in extending operating frequencies or negating their effects in order to keep the price of packaged integrated circuits as low as possible. Bondwires function as lumped circuits consisting of inductors, capacitors, and resistors which can be modeled based on wire geometry. Knowing this, models can be created which approximate the effects of bondwires. With the knowledge of these models, compensation techniques can be implemented which will match the bondwire impedance to the signal line impedance. The effects of these elements on circuit operation is apparent on both signal and power lines to devices. This d...
This article presents a methodology that allows the determination of the matrix representation of a ...
This dissertation develops models for electrical components that are useful for describing or predic...
Abstract — Noise induced by impedance discontinuities from VLSI pack-aging is one of the leading cha...
Wire bond technology is a matured and dominant interconnect methodology compared to other chip inter...
This work is a comprehensive experimental investigation of chip to package wirebond interconnects fo...
Bonding wires are extensively used in integrated circuit (IC) packaging and circuit design in RF app...
A modern power electronic module can save significant energy usage in the power electronic systems b...
When making an Integrated Chip, there is a process called contacting or bonding. In this process, th...
In this contribution, the authors present a systematic approach for optimizing the RF performance of...
We present an antenna modeling method based on partial element equivalent circuit (PEEC) theory. The...
Novel analytical models for accurately and efficiently calculating the inductances of bond wires in ...
In the current semiconductor industry, the technology of semiconductor is more advanced and the size...
Due to the increasing number of components involved in Radio Frequency design, integration and packa...
Bond wire damage is one of the most common failure modes of metal-oxide semiconductor field-effect t...
An approach to fast 3D modeling of the geometry for bonding in RF circuits and packages is demonstra...
This article presents a methodology that allows the determination of the matrix representation of a ...
This dissertation develops models for electrical components that are useful for describing or predic...
Abstract — Noise induced by impedance discontinuities from VLSI pack-aging is one of the leading cha...
Wire bond technology is a matured and dominant interconnect methodology compared to other chip inter...
This work is a comprehensive experimental investigation of chip to package wirebond interconnects fo...
Bonding wires are extensively used in integrated circuit (IC) packaging and circuit design in RF app...
A modern power electronic module can save significant energy usage in the power electronic systems b...
When making an Integrated Chip, there is a process called contacting or bonding. In this process, th...
In this contribution, the authors present a systematic approach for optimizing the RF performance of...
We present an antenna modeling method based on partial element equivalent circuit (PEEC) theory. The...
Novel analytical models for accurately and efficiently calculating the inductances of bond wires in ...
In the current semiconductor industry, the technology of semiconductor is more advanced and the size...
Due to the increasing number of components involved in Radio Frequency design, integration and packa...
Bond wire damage is one of the most common failure modes of metal-oxide semiconductor field-effect t...
An approach to fast 3D modeling of the geometry for bonding in RF circuits and packages is demonstra...
This article presents a methodology that allows the determination of the matrix representation of a ...
This dissertation develops models for electrical components that are useful for describing or predic...
Abstract — Noise induced by impedance discontinuities from VLSI pack-aging is one of the leading cha...