textThis thesis proposes an approach to improve test compression using sequential linear decompressors by using retained free variables. Sequential linear decompressors are inherently efficient and attractive for encoding test vectors with high percentages of don't cares (i.e., test cubes). The encoding of these test cubes is done by solving a system of linear equations. In streaming decompression, a fixed number of free variables are used to encode each test cube. The non-pivot free variables used in Gaussian Elimination are wasted when the decompressor is reset before encoding the next test cube which is conventionally done to keep computational complexity manageable. In this thesis, a technique for retaining the non-pivot free variables ...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
[[abstract]]This paper presents a low power strategy for test data compression and a new decompressi...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
textThis dissertation considers the problem of reducing the storage as well as the bandwidth (data ...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
The output space of a linear decompressor must be sufficiently large to contain all the test cubes i...
A technique is presented here for improving the compression achieved with any linear decompressor by...
Test data compression is an effective methodology for reducing test data volume and testing time. Th...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
We present a new test data compression and decompression architecture based on a novel and efficient...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
[[abstract]]This paper presents a low power strategy for test data compression and a new decompressi...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
textThis dissertation considers the problem of reducing the storage as well as the bandwidth (data ...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
The output space of a linear decompressor must be sufficiently large to contain all the test cubes i...
A technique is presented here for improving the compression achieved with any linear decompressor by...
Test data compression is an effective methodology for reducing test data volume and testing time. Th...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
We present a new test data compression and decompression architecture based on a novel and efficient...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
[[abstract]]This paper presents a low power strategy for test data compression and a new decompressi...