Add to ORKGOne of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data size. In this paper, we introduce a novel compression / decompression scheme based on geometric shapes that substantially reduces the amount of test data and reduces test time. The proposed scheme is based on ordering the test vectors in such a way that enables the generation of geometric shapes that can be highly compressed via perfect lossless compression. Experimental results on ISCAS benchmark circuits demonstrate the effectiveness of the proposed technique in achieving very high compression ratio. Compared to published results, our technique achieves significantly higher compression ratio
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
This thesis details a novel shape-oriented test set compression method that offers an alternative a...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
AbstractTest data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data ...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size...
This thesis details a novel shape-oriented test set compression method that offers an alternative a...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
AbstractTest data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data ...