X-ray diffraction data and structure refinement statistics.
- Weiru Wang (640332)
- Kristi Elkins (640333)
- Angela Oh (469365)
- Yen-Ching Ho (640334)
- Jiansheng Wu (193208)
- Hong Li (20183)
- Yang Xiao (146335)
- Mandy Kwong (640335)
- Mary Coons (640336)
- Bobby Brillantes (640337)
- Eric Cheng (64747)
- Lisa Crocker (640338)
- Peter S. Dragovich (640339)
- Deepak Sampath (640340)
- Xiaozhang Zheng (640341)
- Kenneth W. Bair (640342)
- Thomas O'Brien (640343)
- Lisa D. Belmont (640344)
Publication date
October 2014
DOIAbstract
1<p>Values in parentheses for are of the highest resolution shell</p>2<p>Rsym = Σ|I<sub>hi</sub> - I<sub>h</sub>|/ΣI<sub>hi</sub>, where I<sub>hi</sub> is the scaled intensity of the <i>i</i>th symmetry-related observation of reflection <i>h</i> and I<sub>h</sub> is the mean value.</p>3<p>Rcryst = Σ<sub>h</sub>|F<sub>oh</sub> - F<sub>ch</sub>|/Σ<sub>h</sub>F<sub>oh</sub>, where F<sub>oh</sub> and F<sub>ch</sub> are the observed and calculated structure factor amplitudes for reflection <i>h</i>.</p>4<p>Value of Rfree is calculated for 5% randomly chosen reflections not included in the refinement.</p><p>X-ray diffraction data and structure refinement statistics.</p
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