X-ray data collection and refinement statistics.
- Anne Cleasby (572403)
- Jeff Yon (572404)
- Philip J. Day (572405)
- Caroline Richardson (572406)
- Ian J. Tickle (572407)
- Pamela A. Williams (572408)
- James F. Callahan (572409)
- Robin Carr (572410)
- Nestor Concha (572411)
- Jeffrey K. Kerns (572412)
- Hongwei Qi (430109)
- Thomas Sweitzer (572413)
- Paris Ward (572414)
- Thomas G. Davies (572415)
Publication date
June 2014
DOIAbstract
a<p>R<sub>merge</sub> = Σ<i><sub>h</sub></i>Σ<i><sub>j</sub></i> |I<i><sub>h,j</sub></i>−<i><sub>h</sub></i>|/Σ<i><sub>h</sub></i>Σ<i><sub>j</sub></i>|I<i><sub>h,j</sub></i>|, where I<i><sub>h,j</sub></i> is the <i>j</i>th observation of reflection <i>h</i>.</p>b<p>R<sub>work</sub> = Σ<i><sub>h</sub>||</i>F<i><sub>oh</sub></i>|−|F<i><sub>ch</sub></i>||/Σ<i><sub>h</sub>|</i>F<i><sub>oh</sub></i>|, where F<i><sub>oh</sub></i> and F<i><sub>ch</sub></i> are the observed and calculated structure factor amplitudes respectively for the reflection <i>h</i>.</p>c<p>R<sub>free</sub> is equivalent to R<sub>work</sub> for a 5% subset of reflections not used in the refinement.</p><p>Numbers in parentheses refer to the outer resolution shell.</p
Add to ORKG