X-ray diffraction data collection and refinement statistics.
- He Li (176971)
- Xiaoli Zhang (135098)
- Lijun Bi (121470)
- Jin He (341320)
- Tao Jiang (28401)
Publication date
February 2013
DOIAbstract
a<p>Values in parentheses are for the highest resolution shell.</p>b<p>ASU, asymmetric unit.</p>c<p><i>R</i><sub>work</sub> = Σ||<i>F</i><sub>obs</sub>|–|<i>F</i><sub>calc</sub>||/Σ|<i>F</i><sub>obs</sub>|, where <i>F</i><sub>calc</sub> and <i>F</i><sub>obs</sub> are the calculated and observed structure factor amplitudes, respectively.</p>d<p><i>R</i><sub>free</sub> = as for <i>R</i><sub>work</sub>, but for 3.7% of the total reflections chosen at random and omitted from refinement.</p
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