Diffraction data and refinement statistics.
- Marie-Claude Serre (239217)
- Toufic El Arnaout (410380)
- Mark A. Brooks (410381)
- Dominique Durand (410382)
- Johnny Lisboa (410383)
- Noureddine Lazar (410384)
- Bertrand Raynal (152084)
- Herman van Tilbeurgh (235726)
- Sophie Quevillon-Cheruel (235626)
Publication date
May 2013
DOIAbstract
†<p>Values in parentheses refer to the highest resolution shell (3.18–3.0Å). § <i>R</i><sub>sym</sub> = Σ<i><sub>h</sub></i>Σ<i><sub>i</sub></i> |<<i>I</i>><i><sub>h</sub></i>−<i>I<sub>h,i</sub></i>|/Σ<i><sub>h</sub></i>Σ<i><sub>i</sub> I<sub>h,i</sub></i>, where <<i>I</i>><i><sub>h</sub></i> is the mean intensity for reflection <i>I<sub>h</sub></i> and <i>I<sub>h,i</sub></i> is the intensity of an individual measurement of reflection <i>I<sub>h</sub></i>.</p><p>The <i>R</i><sub>free</sub> was calculated using 341 (4.9%) of the reflections, which were set aside from the refinement.</p
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