Add to ORKGScanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basi
A measurement technique employing the scanning electron microscope is described in which values of t...
Extensive measurements on Teflon and Kapton in a scanning electron microscope indicate the existence...
Levine LE, Reiss G, Smith DA. In situ scanning-tunneling-microscopy studies of current driven mass t...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transis...
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
The purpose of the scanning electron microscopy study was to review the failure history of existing ...
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation pro...
There are several applications where solid devices are exposed to irradiation. Depending on the oper...
Electron precipitation pulsations and loss of charged particles from the magnetospher
Insulating layers on conducting substrate are investigated by means of secondary electron field emis...
Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods...
Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has...
Most of the work carried out in relation to contrast mechanisms and signal formation in an environme...
A review of the Scanning Electron Microscope (SEM) is presented with attention given to its applicat...
A measurement technique employing the scanning electron microscope is described in which values of t...
Extensive measurements on Teflon and Kapton in a scanning electron microscope indicate the existence...
Levine LE, Reiss G, Smith DA. In situ scanning-tunneling-microscopy studies of current driven mass t...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transis...
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
The purpose of the scanning electron microscopy study was to review the failure history of existing ...
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation pro...
There are several applications where solid devices are exposed to irradiation. Depending on the oper...
Electron precipitation pulsations and loss of charged particles from the magnetospher
Insulating layers on conducting substrate are investigated by means of secondary electron field emis...
Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods...
Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has...
Most of the work carried out in relation to contrast mechanisms and signal formation in an environme...
A review of the Scanning Electron Microscope (SEM) is presented with attention given to its applicat...
A measurement technique employing the scanning electron microscope is described in which values of t...
Extensive measurements on Teflon and Kapton in a scanning electron microscope indicate the existence...
Levine LE, Reiss G, Smith DA. In situ scanning-tunneling-microscopy studies of current driven mass t...