Add to ORKGScanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diode
This collective book provides a review of research concentrated on runaway electron beams and X-rays...
There are several applications where solid devices are exposed to irradiation. Depending on the oper...
Insulating layers on conducting substrate are investigated by means of secondary electron field emis...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transis...
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
Infrared thermal maps pinpoint exact location where second breakdown will occur before phenomenon ha...
The purpose of the scanning electron microscopy study was to review the failure history of existing ...
The method of single impulses was used to measure the coefficients of the secondary electronic emiss...
Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has...
The purpose of this dissertation is to examine the behavior of electrons and holes in a semiconducto...
Most of the work carried out in relation to contrast mechanisms and signal formation in an environme...
A brief outline is given of the processes of knock-on damage and electronic damage in electron micro...
Abstract : We present a method for imaging depletion layers using the gaseous secondary electron det...
A beam of energetic electrons incident on a semiconductor produces a variety of effects depending on...
This collective book provides a review of research concentrated on runaway electron beams and X-rays...
There are several applications where solid devices are exposed to irradiation. Depending on the oper...
Insulating layers on conducting substrate are investigated by means of secondary electron field emis...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transis...
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
Infrared thermal maps pinpoint exact location where second breakdown will occur before phenomenon ha...
The purpose of the scanning electron microscopy study was to review the failure history of existing ...
The method of single impulses was used to measure the coefficients of the secondary electronic emiss...
Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has...
The purpose of this dissertation is to examine the behavior of electrons and holes in a semiconducto...
Most of the work carried out in relation to contrast mechanisms and signal formation in an environme...
A brief outline is given of the processes of knock-on damage and electronic damage in electron micro...
Abstract : We present a method for imaging depletion layers using the gaseous secondary electron det...
A beam of energetic electrons incident on a semiconductor produces a variety of effects depending on...
This collective book provides a review of research concentrated on runaway electron beams and X-rays...
There are several applications where solid devices are exposed to irradiation. Depending on the oper...
Insulating layers on conducting substrate are investigated by means of secondary electron field emis...