Add to ORKGFeasibility study of scanning electron microscopy to diagnose properties of small Gunn diode
Scanning electron microscopy is capable to provide chemical information on specimens interesting for...
Thermal management of next generation of semiconductor devices is becoming more challenging, as the ...
The capabilities of the cathodoluminescence mode of the scanning electron microscope are reviewed, w...
The thesis examines the DC and RF performance of double transit region Gunn diodes (DTGD) grown by m...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Extended defects, such as dislocations and grain boundaries, play an important role in determining t...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
The increasing density of components in integrated circuits imposes severe constraints on convention...
Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-74-C-06...
Due to the character of the original source materials and the nature of batch digitization, quality ...
A standard procedure for the determination of the minority carrier diffusion length by means of a sc...
The temporal behavior of high-power diodes is closely related to the impedance collapse caused by th...
A series of low voltage ( \u3c 5 keV) and low temperature ( \u3c 20K) cathodoluminescence (CL) measu...
This paper addresses some of the principles underpinning chemical microanalysis of bulk specimens in...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
Scanning electron microscopy is capable to provide chemical information on specimens interesting for...
Thermal management of next generation of semiconductor devices is becoming more challenging, as the ...
The capabilities of the cathodoluminescence mode of the scanning electron microscope are reviewed, w...
The thesis examines the DC and RF performance of double transit region Gunn diodes (DTGD) grown by m...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
Extended defects, such as dislocations and grain boundaries, play an important role in determining t...
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, a...
The increasing density of components in integrated circuits imposes severe constraints on convention...
Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-74-C-06...
Due to the character of the original source materials and the nature of batch digitization, quality ...
A standard procedure for the determination of the minority carrier diffusion length by means of a sc...
The temporal behavior of high-power diodes is closely related to the impedance collapse caused by th...
A series of low voltage ( \u3c 5 keV) and low temperature ( \u3c 20K) cathodoluminescence (CL) measu...
This paper addresses some of the principles underpinning chemical microanalysis of bulk specimens in...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
Scanning electron microscopy is capable to provide chemical information on specimens interesting for...
Thermal management of next generation of semiconductor devices is becoming more challenging, as the ...
The capabilities of the cathodoluminescence mode of the scanning electron microscope are reviewed, w...