We propose a novel numerical approach for the microwave circuit variability analysis through efficient physics-based simulation of devices operated in nonlinear conditions. The proposed technique allows for a direct link between nonlinear circuit performances and technological parameter variations, and is validated against a class A and a deep class AB power amplifier exampl
A circuit simulation methodology is presented that allows an efficient statistical assessment of mic...
We propose various techniques extending X parameters to include the effect of active microwave devic...
We present an efficient approach to the temperature-dependent physics-based variability analysis of ...
We propose a numerically efficient technique for the mixed-mode physics-based variability analysis o...
In the present article we present a comprehensive variability analysis of microwave power amplifiers...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We present here and in the companion paper (Part II) a general framework for the modeling of semicon...
The authors present an efficient approach to evaluate the large-signal (LS) parametric sensitivity o...
This paper describes a mathematical model which has been adopted for the large-signal performance pr...
A new, efficient approach to the sensitivity analysis of majority carrier and bipolar microwave semi...
Process-induced variability is a growing concern in the design of analog circuits, and in particular...
We present here and in Part I a general framework for the modeling of semiconductor device variabili...
Abstract--In this paper, a unified theory for frequency-domain simula-tion and sensitivity analysis ...
Process Induced Variability (PIV) stemming from fabrication tolerance can impact the performance of ...
The active device X-parameters extracted from physics-based TCAD simulations are imported into the K...
A circuit simulation methodology is presented that allows an efficient statistical assessment of mic...
We propose various techniques extending X parameters to include the effect of active microwave devic...
We present an efficient approach to the temperature-dependent physics-based variability analysis of ...
We propose a numerically efficient technique for the mixed-mode physics-based variability analysis o...
In the present article we present a comprehensive variability analysis of microwave power amplifiers...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We present here and in the companion paper (Part II) a general framework for the modeling of semicon...
The authors present an efficient approach to evaluate the large-signal (LS) parametric sensitivity o...
This paper describes a mathematical model which has been adopted for the large-signal performance pr...
A new, efficient approach to the sensitivity analysis of majority carrier and bipolar microwave semi...
Process-induced variability is a growing concern in the design of analog circuits, and in particular...
We present here and in Part I a general framework for the modeling of semiconductor device variabili...
Abstract--In this paper, a unified theory for frequency-domain simula-tion and sensitivity analysis ...
Process Induced Variability (PIV) stemming from fabrication tolerance can impact the performance of ...
The active device X-parameters extracted from physics-based TCAD simulations are imported into the K...
A circuit simulation methodology is presented that allows an efficient statistical assessment of mic...
We propose various techniques extending X parameters to include the effect of active microwave devic...
We present an efficient approach to the temperature-dependent physics-based variability analysis of ...