We propose various techniques extending X parameters to include the effect of active microwave device variability by exploiting TCAD simulations. We discuss two possible implementations into Agilent ADS. Both approaches are validated against full microwave amplifier TCAD simulations
This letter proposes a sequential sampling technique to generate efficiently multidimensional X-para...
ince the advent of the nonlin-ear vector network analyzer (NVNA), microwave engineers have become fa...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
Process-induced variability is a growing concern in the design of analog circuits, and in particular...
In the present article we present a comprehensive variability analysis of microwave power amplifiers...
Process Induced Variability (PIV) stemming from fabrication tolerance can impact the performance of ...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We propose a novel numerical approach for the microwave circuit variability analysis through efficie...
TCAD simulations are used to extract an accurate temperature-dependent X-parameter active device mod...
We propose a numerically efficient technique for the mixed-mode physics-based variability analysis o...
The active device X-parameters extracted from physics-based TCAD simulations are imported into the K...
The authors present an efficient approach to evaluate the large-signal (LS) parametric sensitivity o...
We present here an efficient numerical approach for the concurrent evaluation of the small-change de...
This paper delivers a considerable improvement in the framework of the statistical simulation of hig...
Resumen El diseño clásico de circuitos de microondas se basa fundamentalmente en el uso de los parám...
This letter proposes a sequential sampling technique to generate efficiently multidimensional X-para...
ince the advent of the nonlin-ear vector network analyzer (NVNA), microwave engineers have become fa...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
Process-induced variability is a growing concern in the design of analog circuits, and in particular...
In the present article we present a comprehensive variability analysis of microwave power amplifiers...
Process Induced Variability (PIV) stemming from fabrication tolerance can impact the performance of ...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We propose a novel numerical approach for the microwave circuit variability analysis through efficie...
TCAD simulations are used to extract an accurate temperature-dependent X-parameter active device mod...
We propose a numerically efficient technique for the mixed-mode physics-based variability analysis o...
The active device X-parameters extracted from physics-based TCAD simulations are imported into the K...
The authors present an efficient approach to evaluate the large-signal (LS) parametric sensitivity o...
We present here an efficient numerical approach for the concurrent evaluation of the small-change de...
This paper delivers a considerable improvement in the framework of the statistical simulation of hig...
Resumen El diseño clásico de circuitos de microondas se basa fundamentalmente en el uso de los parám...
This letter proposes a sequential sampling technique to generate efficiently multidimensional X-para...
ince the advent of the nonlin-ear vector network analyzer (NVNA), microwave engineers have become fa...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...