March test and on-chip test circuit of flash memories

[[abstract]]A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems of NAND- and NOR- type flash memories. With the hardware penalty of a 3- or 4-bit counter, test of a flash memory can be achieved in few seconds by adopting these proposed test strategies[[fileno]]2030110030017[[department]]電機工程學