Add to ORKGAbstract: This paper presents an overview of the problem of testing semiconductor random access memories (RAM’s). An important aspect of this test procedure is the detection of permanent faults that cause the memory to function incorrectly. Functional-level fault models are very useful for describing a wide variety of RAM faults. Several Fault models are discussed throughout the paper, including the stuck-at-0/1 faults, coupled-cell faults presented and their fault coverage and execution times are discussed
[[abstract]]Although there are well known test algorithms that have been used by the industry for ye...
[[abstract]]In order to ease the time-to-market pressure of flash memory, we propose a fault-pattern...
[[abstract]]Flash memories are a type of non-volatile memory based on floating-gate transistors. The...
Testing NAND flash memories is a very complex issue due to the rapid scaling down of the technology ...
[[abstract]]© 2002 Institute of Electrical and Electronics Engineers - The size and density of semic...
[[abstract]]To explore all faulty behavior on NAND-type flash memory is impractical, and the defects...
Advance of the fabrication technology has enhanced the size and density for the NAND Flash memory bu...
[[abstract]]In this paper, we present a memory fault simulator called the Random Access Memory Simul...
[[abstract]]In this paper we present a fault simulator for flash memory testing and diagnostics, cal...
Abstract. Static random-access memories (SRAMs) exhibit faults that are electrical in nature. Functi...
[[abstract]]The famous NOR-type flash memory structure is included to develop flash memory fault mod...
The fast growing of technologies has enabled the Static Random Access Memories (SRAMs) to contain hi...
[[abstract]]A March test, namely "March Flash" and an on-chip test circuit are presented to detect a...
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. ...
[[abstract]]Although there are well known test algorithms that have been used by the industry for ye...
[[abstract]]Although there are well known test algorithms that have been used by the industry for ye...
[[abstract]]In order to ease the time-to-market pressure of flash memory, we propose a fault-pattern...
[[abstract]]Flash memories are a type of non-volatile memory based on floating-gate transistors. The...
Testing NAND flash memories is a very complex issue due to the rapid scaling down of the technology ...
[[abstract]]© 2002 Institute of Electrical and Electronics Engineers - The size and density of semic...
[[abstract]]To explore all faulty behavior on NAND-type flash memory is impractical, and the defects...
Advance of the fabrication technology has enhanced the size and density for the NAND Flash memory bu...
[[abstract]]In this paper, we present a memory fault simulator called the Random Access Memory Simul...
[[abstract]]In this paper we present a fault simulator for flash memory testing and diagnostics, cal...
Abstract. Static random-access memories (SRAMs) exhibit faults that are electrical in nature. Functi...
[[abstract]]The famous NOR-type flash memory structure is included to develop flash memory fault mod...
The fast growing of technologies has enabled the Static Random Access Memories (SRAMs) to contain hi...
[[abstract]]A March test, namely "March Flash" and an on-chip test circuit are presented to detect a...
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. ...
[[abstract]]Although there are well known test algorithms that have been used by the industry for ye...
[[abstract]]Although there are well known test algorithms that have been used by the industry for ye...
[[abstract]]In order to ease the time-to-market pressure of flash memory, we propose a fault-pattern...
[[abstract]]Flash memories are a type of non-volatile memory based on floating-gate transistors. The...