A combined X-ray and optical interferometer capable of centimeter displacements has been made to measure the lattice parameter of Si crystals to within a 3 x 10(-9) relative uncertainty. This paper relates the results of test measurements carried out to assess the capabilities of the apparatus
Résumé. 2014 L’essentiel de l’interférométrie des rayons X et ses applications principales sont revu...
The unexplained inconsistency of the measured values of the Planck constant indicates that an error ...
The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferom...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
X-ray interferometry established a link between atomic and macroscopic realisations of the metre. Th...
documenta il manufatto "sistema di traslazione con risoluzione sub-nanometrica" prodotto nell'ambito...
The measurement of the angle between an interferometer's front mirror and the diffracting planes is ...
A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) t...
Highly purified silicon single crystals are excellent standards for length measurements at the atomi...
Future measurements of the silicon lattice-parameter by combined X-ray and optical interferometry re...
The essentials of X-ray interferometry and its principal application fields are reviewed. Very small...
The spacing of the {2 2 0} lattice planes of a 28Si crystal, used to determine the Avogadro constant...
Further details are given of an experiment based on combined X-ray and optical interferometry to mea...
The requirement for calibrating transducers having subnanometre displacement sensitivities stimulate...
Résumé. 2014 L’essentiel de l’interférométrie des rayons X et ses applications principales sont revu...
The unexplained inconsistency of the measured values of the Planck constant indicates that an error ...
The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferom...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
X-ray interferometry established a link between atomic and macroscopic realisations of the metre. Th...
documenta il manufatto "sistema di traslazione con risoluzione sub-nanometrica" prodotto nell'ambito...
The measurement of the angle between an interferometer's front mirror and the diffracting planes is ...
A new translation device has been developed at the Istituto di Metrologia ''G. Colonnetti'' (IMGC) t...
Highly purified silicon single crystals are excellent standards for length measurements at the atomi...
Future measurements of the silicon lattice-parameter by combined X-ray and optical interferometry re...
The essentials of X-ray interferometry and its principal application fields are reviewed. Very small...
The spacing of the {2 2 0} lattice planes of a 28Si crystal, used to determine the Avogadro constant...
Further details are given of an experiment based on combined X-ray and optical interferometry to mea...
The requirement for calibrating transducers having subnanometre displacement sensitivities stimulate...
Résumé. 2014 L’essentiel de l’interférométrie des rayons X et ses applications principales sont revu...
The unexplained inconsistency of the measured values of the Planck constant indicates that an error ...
The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferom...
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