Future measurements of the silicon lattice-parameter by combined X-ray and optical interferometry require displacement measurements having 10 -9 relative accuracy. Experimental and numerical investigations are under way to bring into light the limiting factors, excluding or identifying and eliminating them
In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferomete...
We report about numerical and experimental investigations of the thermal gradients in the INRIM's co...
The measurement of the angle between an interferometer's front mirror and the diffracting planes is ...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
Highly purified silicon single crystals are excellent standards for length measurements at the atomi...
The unexplained inconsistency of the measured values of the Planck constant indicates that an error ...
A combined X-ray and optical interferometer capable of centimeter displacements has been made to mea...
The requirement for calibrating transducers having subnanometre displacement sensitivities stimulate...
By using the formalism developed in Part I, we investigated errors in the measurement of the silicon...
Further details are given of an experiment based on combined X-ray and optical interferometry to mea...
A model of a monolithic silicon LLL scanning X-ray interferometer capable of displacements up to 100...
We have developed a null laser interferometer capable of picometer resolution in fringe division for...
This paper describes how the angular spectrum of a laser beam is determined, in order to estimate th...
The essentials of X-ray interferometry and its principal application fields are reviewed. Very small...
In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferomete...
We report about numerical and experimental investigations of the thermal gradients in the INRIM's co...
The measurement of the angle between an interferometer's front mirror and the diffracting planes is ...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts pe...
Highly purified silicon single crystals are excellent standards for length measurements at the atomi...
The unexplained inconsistency of the measured values of the Planck constant indicates that an error ...
A combined X-ray and optical interferometer capable of centimeter displacements has been made to mea...
The requirement for calibrating transducers having subnanometre displacement sensitivities stimulate...
By using the formalism developed in Part I, we investigated errors in the measurement of the silicon...
Further details are given of an experiment based on combined X-ray and optical interferometry to mea...
A model of a monolithic silicon LLL scanning X-ray interferometer capable of displacements up to 100...
We have developed a null laser interferometer capable of picometer resolution in fringe division for...
This paper describes how the angular spectrum of a laser beam is determined, in order to estimate th...
The essentials of X-ray interferometry and its principal application fields are reviewed. Very small...
In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferomete...
We report about numerical and experimental investigations of the thermal gradients in the INRIM's co...
The measurement of the angle between an interferometer's front mirror and the diffracting planes is ...
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