As technology scaling enters the nanometer regime, design of large scale ICs gets more challenging due to shrinking feature sizes and increasing design complexity. Aggressive scaling causes significant degradation in reliability, increased susceptibility to fabrication and environmental randomness and increased dynamic and leakage power dissipation. In this work, we investigate these scaling issues in large scale integrated systems. This dissertation proposes to develop variability-aware design methodologies by proposing design analysis, design-time optimization, post-silicon tunability and runtime-adaptivity based optimization techniques for handling variability. We discuss our research in the area of variability-aware analysis, specific...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
The incessant technology scaling has enabled the integration of functionally complex System-on-Chip ...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
As Very Large Scale Integration (VLSI) technology moves to the nanoscale regime, design and manufac...
As Very Large Scale Integration (VLSI) technology moves to the nanoscale regime, design and manufac...
The scaling of VLSI technology has spurred a rapid growth in the semiconductor industry. With the CM...
Systems have been designed and synthesized using CMOS technology for many years, with improvements i...
Abstract — Process variations cause design performance to become unpredictable in deep sub-micron te...
Parameter variations, which are increasing along with advances in process technologies, affect both...
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large incre...
Since process variation and chip performance uncertainties have become more pronounced as technologi...
This work focuses on two emerging fields in VLSI. The first is use of statistical formulations to ta...
Transistor variability has emerged as one of the important constraints in Nano-CMOS circuit design. ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
The incessant technology scaling has enabled the integration of functionally complex System-on-Chip ...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
As Very Large Scale Integration (VLSI) technology moves to the nanoscale regime, design and manufac...
As Very Large Scale Integration (VLSI) technology moves to the nanoscale regime, design and manufac...
The scaling of VLSI technology has spurred a rapid growth in the semiconductor industry. With the CM...
Systems have been designed and synthesized using CMOS technology for many years, with improvements i...
Abstract — Process variations cause design performance to become unpredictable in deep sub-micron te...
Parameter variations, which are increasing along with advances in process technologies, affect both...
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large incre...
Since process variation and chip performance uncertainties have become more pronounced as technologi...
This work focuses on two emerging fields in VLSI. The first is use of statistical formulations to ta...
Transistor variability has emerged as one of the important constraints in Nano-CMOS circuit design. ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
The incessant technology scaling has enabled the integration of functionally complex System-on-Chip ...