This work focuses on two emerging fields in VLSI. The first is use of statistical formulations to tackle one of the classical problems in VLSI design and analysis domains, namely gate sizing. The second is on analysis of nontraditional digital systems in the form of cyclic combinational circuits. In the first part, a new approach for enhancing the process-variation tolerance of digital circuits is described. We extend recent advances in statistical timing analysis into an optimization framework. Our objective is to reduce the performance variance of a technology-mapped circuit where delays across elements are represented by random variables which capture the manufacturing variations. We introduce the notion of statistical critical paths, wh...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
Abstract In this paper, we approach the gate sizing problem in VLSI circuits in the context of incr...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
Very-large-scale-integration (VLSI) circuit design heavily relies on computer aided design (CAD) too...
textLogic optimization and clock network optimization for power, performance and area trade-off have...
Abstract—In this paper, we propose a statistical gate sizing ap-proach to maximize the timing yield ...
Journal ArticleThis paper presents the stochastic cycle period as a performance metric for timed asy...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
In the next generation of VLSI circuits, concurrent optimizations will be essential to achieve the p...
The relentless push for high performance in custom dig-ital circuits has led to renewed emphasis on ...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
Abstract In this paper, we approach the gate sizing problem in VLSI circuits in the context of incr...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
Very-large-scale-integration (VLSI) circuit design heavily relies on computer aided design (CAD) too...
textLogic optimization and clock network optimization for power, performance and area trade-off have...
Abstract—In this paper, we propose a statistical gate sizing ap-proach to maximize the timing yield ...
Journal ArticleThis paper presents the stochastic cycle period as a performance metric for timed asy...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
In the next generation of VLSI circuits, concurrent optimizations will be essential to achieve the p...
The relentless push for high performance in custom dig-ital circuits has led to renewed emphasis on ...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Aggressive device scaling has made it imperative to account for process variations in the design flo...