Microcantilever dynamics in tapping mode atomic force microscopy is addressed via a multimode approximation, which allows to consider external excitation at primary or secondary resonance and to highlight the effect of higher order eigenmodes. Upon presenting the AFM model and its multimode discretization, the dynamic response is investigated via numerical simulation of singleand three-mode models by considering different bifurcation parameters. Typical features of tapping mode AFM response as nonlinear hysteresis, bistability, higher harmonics contribution, impact velocity and contact force are addressed. The analysis is conducted by evaluating damping of higher modes according to the Rayleigh criterion, which basically accounts for struct...
In this paper, we investigate the mechanism of atomic force microscopy in tapping mode (AFM-TM) unde...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accu...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
We present an exploratory study of multimodal tapping-mode atomic force microscopy driving more than...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode a...
This paper illustrates through numerical simulation the complexities encountered in high-damping AFM...
Numerous dynamic atomic force micros- copy (AFM) methods have appeared in recent years, which make u...
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode at...
While conventional techniques in dynamic mode atomic force microscopy typically involve the excitati...
Atomic force microscopy (AFM) uses a scanning process performed by a microcantilever probe to create...
We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microsc...
It is well known in the literature that AFMs operating in dynamic mode can exhibit several nonlinear...
In this paper, we investigate the mechanism of atomic force microscopy in tapping mode (AFM-TM) unde...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accu...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
We present an exploratory study of multimodal tapping-mode atomic force microscopy driving more than...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode a...
This paper illustrates through numerical simulation the complexities encountered in high-damping AFM...
Numerous dynamic atomic force micros- copy (AFM) methods have appeared in recent years, which make u...
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode at...
While conventional techniques in dynamic mode atomic force microscopy typically involve the excitati...
Atomic force microscopy (AFM) uses a scanning process performed by a microcantilever probe to create...
We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microsc...
It is well known in the literature that AFMs operating in dynamic mode can exhibit several nonlinear...
In this paper, we investigate the mechanism of atomic force microscopy in tapping mode (AFM-TM) unde...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accu...