While conventional techniques in dynamic mode atomic force microscopy typically involve the excitation of the first flexural mode of a microcantilever, situations arise where the excitation of higher modes may result in image artefacts. Strong nonlinear coupling between the cantilever modes in liquid environments may result in image artefacts, limiting the accuracy of the image. Similar observations have been made in high-speed contact mode AFM. To address this issue, we propose the application of the modulated–demodulated control technique to attenuate problematic modes to eliminate the image artefacts. The modulated–demodulated control technique is a high-bandwidth technique, which is well suited to the control of next generation of high-...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
The speed of tapping mode imaging with the atomic force microscope (AFM) has been increased by over ...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
Research Doctorate - Doctor of Philosophy (PhD)The atomic force microscope is possibly one of the gr...
Understanding the modal response of an atomic force microscope is important for the identification o...
Research Doctorate - Doctor of Philosophy (PhD)The Atomic Force Microscope (AFM) is a mechanical mic...
Numerous dynamic atomic force micros- copy (AFM) methods have appeared in recent years, which make u...
We outline the application of modulated-demodulated control to the quality (Q) factor control of an ...
The need for investigating the properties of new materials at nanoscale level continuously pushes th...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
We present a high-speed operating method with feedback to be used in dynamic atomic force microscope...
The possibility of many new applications and novel scientific observations can be provided by effici...
When operating the Atomic Force Microscope in tapping mode it is possible to decrease the quality fa...
Traditional dynamic modalities for atomic force microscopy imaging suffer from a stringent trade-off...
We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding p...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
The speed of tapping mode imaging with the atomic force microscope (AFM) has been increased by over ...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
Research Doctorate - Doctor of Philosophy (PhD)The atomic force microscope is possibly one of the gr...
Understanding the modal response of an atomic force microscope is important for the identification o...
Research Doctorate - Doctor of Philosophy (PhD)The Atomic Force Microscope (AFM) is a mechanical mic...
Numerous dynamic atomic force micros- copy (AFM) methods have appeared in recent years, which make u...
We outline the application of modulated-demodulated control to the quality (Q) factor control of an ...
The need for investigating the properties of new materials at nanoscale level continuously pushes th...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
We present a high-speed operating method with feedback to be used in dynamic atomic force microscope...
The possibility of many new applications and novel scientific observations can be provided by effici...
When operating the Atomic Force Microscope in tapping mode it is possible to decrease the quality fa...
Traditional dynamic modalities for atomic force microscopy imaging suffer from a stringent trade-off...
We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding p...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
The speed of tapping mode imaging with the atomic force microscope (AFM) has been increased by over ...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...