This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-surface interactions that include van der Waals and Derjaguin-Muller-Toporov contact forces. We investigate the periodic solutions of the hybrid system by performing numerical pseudo-arclength continuation. Through the use of bifurcation locus maps in the set of parameters of the discontinuous model, the overall dynamical response scenario is assessed. We demonstrate the influence of various dissipation mechanisms that are related with the AFM touching or lacking contact with the sample. Local and global analyses are used to investigate the stability of the stable solution in the repulsive regime. The impacting nonsmooth dynamics framed within ...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode at...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
In tapping-mode atomic force microscopy, nonlinear e¤ects due to large variations in the force …eld ...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode at...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
In tapping-mode atomic force microscopy, nonlinear e¤ects due to large variations in the force …eld ...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode at...