This paper presents a detailed hot-electron physical device model suitable for the large-signal modelling of GaAs transferred electron devices. All results presented are compared with experimental results, essential for the verification and validation of the model especially for this inherently non-linear, circuit-dependent device. The incorporation of the conservation equations has a marked effect on the theoretical behaviour of the device. It is essential if high frequency and power devices are to be modelled accurately since electron relaxation effects play a much bigger role at higher frequencies and in harmonic generation
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
A technology-independent model of microwave electron devices, the Nonlinear Integral Model, is propo...
This paper presents a detailed hot-electron physical device model suitable for the large-signal mode...
The paper presents an efficient approach to evaluate the performance of electron devices under non s...
A technology-independent, non-quasi-static non-linear model of electron devices capable of accurate ...
The paper presents an efficient approach to evaluate the performance of electron devices under non s...
A new nonquasi-static nonlinear model of electron devices is proposed by adopting a perturbed charge...
L'importance des effets transitoires des électrons chauds dans les dispositifs semi-conducteurs augm...
none6Theoretical and practical issues concerning the non-linear dynamic modelling of electron device...
Physical simulation of semiconductor devices at high frequencies involves not only semiconductor tra...
Low-frequency dispersive phenomena due to self-heating and/or traps (that is, surface-state densitie...
none6Low-frequency dispersive phenomena due to self-heating and/or “traps” (that is, surface-state d...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
A general purpose mathematical approach is proposed for the large-signal modelling of microwave elec...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
A technology-independent model of microwave electron devices, the Nonlinear Integral Model, is propo...
This paper presents a detailed hot-electron physical device model suitable for the large-signal mode...
The paper presents an efficient approach to evaluate the performance of electron devices under non s...
A technology-independent, non-quasi-static non-linear model of electron devices capable of accurate ...
The paper presents an efficient approach to evaluate the performance of electron devices under non s...
A new nonquasi-static nonlinear model of electron devices is proposed by adopting a perturbed charge...
L'importance des effets transitoires des électrons chauds dans les dispositifs semi-conducteurs augm...
none6Theoretical and practical issues concerning the non-linear dynamic modelling of electron device...
Physical simulation of semiconductor devices at high frequencies involves not only semiconductor tra...
Low-frequency dispersive phenomena due to self-heating and/or traps (that is, surface-state densitie...
none6Low-frequency dispersive phenomena due to self-heating and/or “traps” (that is, surface-state d...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
A general purpose mathematical approach is proposed for the large-signal modelling of microwave elec...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
The paradigm shift from a field- to an energy-based framework in the modeling of hot-carrier-induced...
A technology-independent model of microwave electron devices, the Nonlinear Integral Model, is propo...