International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. Large TID-induced electrical shifts are observed in devices with thin dielectrics. Trapping and detrapping properties are discussed using dedicated irradiation/annealing experiment
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
Total ionizing radiation may affect the electrical response of the electronic systems, inducing a va...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
Total ionizing dose (TID) effects are studied for a long time in micro-electronic components designe...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
This presentation provides an overview of Total Ionizing Dose effects in CMOS bulk and SOI technolog...
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
Total ionizing radiation may affect the electrical response of the electronic systems, inducing a va...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceThis work investigates MGy Total Ionizing Dose effects in CMOS technologies. L...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
Total ionizing dose (TID) effects are studied for a long time in micro-electronic components designe...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
International audienceTotal ionizing dose (TID) effects are studied for a long time in micro-electro...
This presentation provides an overview of Total Ionizing Dose effects in CMOS bulk and SOI technolog...
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
International audienceThis paper investigates the vulnerability of several micro- and nano-electroni...
Total ionizing radiation may affect the electrical response of the electronic systems, inducing a va...
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