Failure mechanisms, fault hypotheses and analytical testing of LSI-NMOS (HMOS) circuits

ISBN: 0122968603Describes the classification of failure mechanisms, followed by its application to both electrical and logical levels for NMOS (HMOS) technology. A link between failure analysis, from reliability physics, and test design is thus carried out. Classes for fault hypotheses are given as a function of possible occurrences of failure mechanisms, and of the ease of test generation. Test vector generation methods are illustrated, both at gate level, and at the level of typical complex circuits such as ALU, ROM and PLA. The classes of hypotheses are well defined. The future developments of analytical testing are discussed together with the evolution of the design automation of VLSI parts