Add to ORKGThe authors establish main guidelines of new methods and new tools which allows one to test for failure analysis of VLSI circuits. Methods are new specific test methods and the tool is the electron microscope allied to voltage contrast. Although not yet operational, the way presented is certainly a (THE) way towards failure analysis. The methods described are oriented towards microprocessor-type circuits and are different according to the degree of knowledge concerning the analyzed circuit. Examples to illustrate the subject are extracted from the M6800/MC6800 microprocessor
The selection of adequate fault models is crucial to generating tests of high quality for complex di...
The test of present integrated circuits exhibits many confining aspects, among them the adequate sel...
Most techniques for Failure Mode and Effect Analysis (FMEA) of the electronic equipment and circuits...
ISBN: 0818607262A strategy is derived for failure analysis in random logic devices such as microproc...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
ISBN: 0122968603Describes the classification of failure mechanisms, followed by its application to b...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Attention is given first to the various applications that can take advantage of e-beam testing: insp...
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
NUMBER OF PAGES: xv+413Considers failures disrupting the programs in microprocessors, i.e. failures ...
The test of present integrated circuits exhibits many confining aspects, among them the adequate sel...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
The selection of adequate fault models is crucial to generating tests of high quality for complex di...
The test of present integrated circuits exhibits many confining aspects, among them the adequate sel...
Most techniques for Failure Mode and Effect Analysis (FMEA) of the electronic equipment and circuits...
ISBN: 0818607262A strategy is derived for failure analysis in random logic devices such as microproc...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
ISBN: 0122968603Describes the classification of failure mechanisms, followed by its application to b...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Attention is given first to the various applications that can take advantage of e-beam testing: insp...
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
NUMBER OF PAGES: xv+413Considers failures disrupting the programs in microprocessors, i.e. failures ...
The test of present integrated circuits exhibits many confining aspects, among them the adequate sel...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
The selection of adequate fault models is crucial to generating tests of high quality for complex di...
The test of present integrated circuits exhibits many confining aspects, among them the adequate sel...
Most techniques for Failure Mode and Effect Analysis (FMEA) of the electronic equipment and circuits...