International audienceThe images obtained with a transmission electron detector in low voltage SEM show an evolution of the well known dark field and bright field contrast with the accelerating voltage. Monte Carlo simulations explain these contrasts by the evolution of the electron scattering angle and stopping power of the thin foil with the accelerating voltage
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...
To correlate atomistic structure with longer range electric field distribution within materials, it ...
For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the I...
Due to the influence of refraction effects on the escape probability of the Back-Scattered Electrons...
There is an urgent need for fast, non-destructive and quantitative two-dimensional dopant profiling ...
The low energy scanning electron microscope (SEM) which is currently at the Institute of\nScientific...
Low voltage imaging, X-ray microanalysis and X-ray mapping has become very important for the investi...
Current methodology of imaging in the scanning electron microscopy is based on the detection of sign...
A configuration of the cathode lens, composed of a boarded-scintillator type anode/detector assembly...
This work contains theoretical description of basic features and principles of electron microscopy, ...
To operate down to units of eV with a small primary spot size, a cathode lens with a biased specimen...
The scintillator-photomultiplier detection system installed under the pole piece represents the most...
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and at...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
In 1981 Prof. Sir Alec Broers suggested that the spatial limit of direct writing electron beam litho...
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...
To correlate atomistic structure with longer range electric field distribution within materials, it ...
For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the I...
Due to the influence of refraction effects on the escape probability of the Back-Scattered Electrons...
There is an urgent need for fast, non-destructive and quantitative two-dimensional dopant profiling ...
The low energy scanning electron microscope (SEM) which is currently at the Institute of\nScientific...
Low voltage imaging, X-ray microanalysis and X-ray mapping has become very important for the investi...
Current methodology of imaging in the scanning electron microscopy is based on the detection of sign...
A configuration of the cathode lens, composed of a boarded-scintillator type anode/detector assembly...
This work contains theoretical description of basic features and principles of electron microscopy, ...
To operate down to units of eV with a small primary spot size, a cathode lens with a biased specimen...
The scintillator-photomultiplier detection system installed under the pole piece represents the most...
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and at...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
In 1981 Prof. Sir Alec Broers suggested that the spatial limit of direct writing electron beam litho...
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...
To correlate atomistic structure with longer range electric field distribution within materials, it ...
For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the I...
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